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Advanced Simulation and Test Methodologies for VLSI Design by G. Russell and I.L. Sayers

Advanced Simulation and Test Methodologies for VLSI Design
Publisher: Springer | ISBN: 0747600015 | edition 1989 | PDF | 396 pages | 13 mb

The testing of digital circuits has been problematic since time immemorial; however with the introduction of VLSI the problems have been aggravated by several factors in addition to those associated with the increase in complexity and reduction in the pin to gate ratio.


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